Faculty
Tasks
Students
Papers
Demos
Posters
Talks
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- IFRA: Instruction Footprint Recording and Analysis for Post-Silicon Bug Localization of Processors,
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- Modeling of NBTI-Induced PMOS Degradation under Arbitrary Dynamic Temperature Variation,
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- Hardware Verification: Methodology, Techniques and Solutions,
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- Circuit Failure Prediction for Robust System Design in Scaled CMOS,
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- On the Duality between Vacuity and Coverage,
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- Node criticality computation for circuit timing analysis and optimization under NBTI effect,
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- SymPLFIED: Symbolic Program-Level Fault-Injection and Error-Detection Framework,
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- Metrics for Architecture-Level Lifetime Reliability Analysis,
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- Characterization of NBTI induced Temporal Performance Degradation in Nano-Scale SRAM array using IDDQ,
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- The Effect of Process Variation on Device Temperature in FinFET Circuits,
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- StageNet: A Reconfigurable CMP Fabric for Resilient Systems,
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- An efficient method to identify critical gates under circuit aging,
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- Software-Based Online Detection of Hardware Defects: Mechanisms, Architectural Support, and Evaluation,
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