| | GSRC Student Profile:
Research Overview: Digitally-Assisted Analog/RF Testing for Mixed-Signal SoCs
We are investigating a testing methodology for analog and radio-frequency (RF) circuitry that incorporates digital circuits for performance calibration and adaptation. This method explores the reuse of built-in digital calibration circuitry, along with minor digital design-for-testability (DfT) modifications, to test and characterize analog/RF circuit performance. By observing the digital tuning signals captured in the digital calibration circuitry, the analog/RF performance can be closely estimated, thus enabling cost-effective Go/No-Go production testing. We have applied this testing methodology through case studies of an adaptive equalizer and a digitally-calibrated Weaver image-reject receiver.
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