| | GSRC Student Profile:
Research Overview: Reliability Effects of Soft Errors and NBTI On Digital Circuits
Aggressive downscaling of transistor sizes for increased performance and lower costs have
pushed the devices to their physical limits. Reliability effects have become
a major bottleneck due to different physical phenomena and introduction of newer materials.
My research concentrates on the impact of two different reliability threats namely the radiation induced soft errors and Negative Bias Temperature Instability (NBTI) on digital circuits.
| |
