| | The Test Special Interest Group (Test SIG) brings together GSRC faculty, students, and industrial researchers involved in test and diagnosis. Most of the GSRC test efforts focus on resiliency with an overall goal of developing future test and diagnosis solutions for supporting self-adaptable and error-resilient systems. Our current research efforts include: (1) cost-effective embedded self-test and on-line checking for detecting subtle manufacturing defects as well as post-manufacturing failures; (2) automatic diagnosis for locating sources of critical failures; (3) identification and extraction of system-relevant parameters for effective modeling and prediction of critical failures, and intelligent use of on-chip sensors/monitors to produce signatures for failure prediction; and (4) self-tuning, self-compensation, and/or self-recovery schemes for heterogeneous components, including logic, high-speed IO, RF, and memory components.
We welcome interactions with researchers in our sponsor companies who are involved in various aspects of testing. The Test SIG will organize events at major test conferences to bring together the GSRC test community for regular, in-depth technical interactions.
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