Citation
Hongjoong Shin, Byoungho Kim, Jacob Abraham. "Spectral prediction for specification-based loopback test of Embedded Mixed-signal Circuits". VLSI Test Symposium, 412-417, April, 2006.

Abstract
Loopback testing of Mixed-signal SOCs provides a low-cost test solution, but suffers from fault masking, resulting in serious yield loss and low test accuracy. This paper presents an efficient loopback test methodology which enables individual characterization of dynamic performance of Devices Under Test (DUTs) in loopback mode. DUTs are loop-backed externally on a loadboard (DUT board), and a simple filter and an analog adder on the loadboard produce a composite loopback response. Characteristic parameters are extracted from these loopback responses, and a non-linear regression technique based on spectral predictors is used to predict various performance parameters such as Gain, SNR, THD and SINAD. The spectral predictor provides more accurate and reliable prediction compared to a time-domain approach. Both simulation and hardware measurements are presented to validate the proposed technique.

Electronic downloads

• shin-loopback_updated.pdf · application/pdf · 436 kbytes

Citation formats

• HTML

  Hongjoong Shin, Byoungho Kim, Jacob Abraham. <a
  href="http://www.gigascale.org/pubs/889.html">Spectral
  prediction for specification-based loopback test of Embedded
  Mixed-signal Circuits</a>, VLSI Test Symposium,
  412-417, April, 2006.

• Plain text

  Hongjoong Shin, Byoungho Kim, Jacob Abraham. "Spectral
  prediction for specification-based loopback test of Embedded
  Mixed-signal Circuits". VLSI Test Symposium, 412-417, April,
  2006.

• BibTeX

  @inproceedings{ShinKimAbraham06_SpectralPredictionForSpecificationbasedLoopbackTest,
      author = {Hongjoong Shin and Byoungho Kim and Jacob Abraham},
      title = {Spectral prediction for specification-based
                loopback test of Embedded Mixed-signal Circuits},
      booktitle = {VLSI Test Symposium},
      pages = {412-417},
      month = {April},
      year = {2006},
      abstract = {Loopback testing of Mixed-signal SOCs provides a
                low-cost test solution, but suffers from fault
                masking, resulting in serious yield loss and low
                test accuracy. This paper presents an efficient
                loopback test methodology which enables individual
                characterization of dynamic performance of Devices
                Under Test (DUTs) in loopback mode. DUTs are
                loop-backed externally on a loadboard (DUT board),
                and a simple filter and an analog adder on the
                loadboard produce a composite loopback response.
                Characteristic parameters are extracted from these
                loopback responses, and a non-linear regression
                technique based on spectral predictors is used to
                predict various performance parameters such as
                Gain, SNR, THD and SINAD. The spectral predictor
                provides more accurate and reliable prediction
                compared to a time-domain approach. Both
                simulation and hardware measurements are presented
                to validate the proposed technique.},
      URL = {http://www.gigascale.org/pubs/889.html}
  }
  

Posted by Hongjoong Shin, Ph.D on 1 Aug 2006..

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