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Bin Zhang
University of Texas at Austin
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zhangb4
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bzhang@ece.utexas.edu
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Bin Zhang received his BS degree in Applied Physics from Shanghai Jiao Tong University, China in 1994, his MSEE degree from University of Texas at Austin in 2001. He is expected to receive his PhD degree from University of Texas at Austin in 2008. His advisor is Prof. Michael Orshansky. His research interest is in IC reliability (soft error, NBTI, etc.) modeling, analysis, and improvement techniques. His paper "FASER: Fast Analysis of Soft Error Susceptibility for Cell-Based Designs" won the Best Paper Award of International Symposium on Quality Electronic Design (ISQED) in 2006. His another paper Modeling of NBTI-induced PMOS degradation under arbitrary dynamic temperature variation, received the IBM Research Award at the 2008 Graduate and Industry Networking Conference (GAIN 2008), University of Texas at Austin, for the best paper & presentation at the GAIN 2008 conference in materials science and Nano, Micro, Bio & MEMS engineering.
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