Prof. Mitra’s research interests include robust system design, VLSI design, CAD, validation and test, and emerging nanotechnologies. He has co-authored more than 140 technical papers, and has invented design and test techniques that have seen wide-spread proliferation in the semiconducor industry. His X-Compact technique for test compression has been used by more than 50 Intel products, and has influenced major CAD tools. The IFRA technology for post-silicon validation, created jointly with his student, was characterized as “a breakthrough” in the Communications of the ACM. His work on the first demonstration of imperfection-immune carbon nanotube VLSI circuits, jointly with his students and collaborators, was selected by NSF as a Research Highlight to the US Congress, and was highlighted as “significant breakthrough” by the Semiconductor Research Corporation and the MIT Technology Review.

Prof. Mitra’s major honors include the Presidential Early Career Award for Scientists and Engineers, the highest US honor for early-career outstanding scientists and engineers, ACM SIGDA Outstanding New Faculty Award, IEEE CAS/CEDA Pederson Award for the IEEE Trans. CAD Best Paper, IEEE/ACM Design Automation Conference Best Paper Award, Terman Fellowship, IBM Faculty Awards, a Divisional Recognition Award from Intel "for a Breakthrough Soft Error Protection Technology," a Best Paper Award at the Intel Design and Test Technology Conference, and the Intel Achievement Award, Intel’s highest corporate honor. Prof. Mitra also serves as an invited member on DARPA’s Information Science and Technology Study Group.