Professor Abraham has published extensively in the areas of VLSI testing, verification and fault tolerance. He has supervised more than 50 Ph.D. dissertations. He has been elected Fellow of the IEEE and of the ACM. He has served as associate editor of the IEEE Transactions on Computer-Aided Design and the IEEE Transactions on VLSI Systems, and as chair of the IEEE Computer Society Technical Committee on Fault-Tolerant Computing. He received best paper awards from the Design Automation Conference in 1993 and from the VLSI Test Symposium in 2003. He is currently working with local industry in developing a new Master's program in Electrical and Computer Engineering focusing on Digital and Mixed-Signal Circuit Design.

His current research involves hierarchical techniques to develop highly effective manufacturing tests for digital and analog integrated circuits, as well as new approaches to verifying the correctness of complex integrated circuits.